No. 10070: Image Checker
A carbon film with many holes of various sizes. More stable and easier to observe than carbon lace under the electron beam. Mounted on a copper grid. Determines quality of image, astigmatism and compensation of objective pole pieces.
No. 10090: Resolution Standard
Gold-palladium particles used for determining the resolving power of the electron microscope by the point-to-point separation method. Made by shadow casting at a low angle with gold-palladium over tungsten oxide particles deposited on a super thin film for maximum contrast. Mounted on a 400 mesh copper grid.
Internal Diffraction Calibration Standards
Gold or aluminum coating over one-third of a standard Vinylec (Polyvinyl
Formal) or nitrocellulose substrate. Provides necessary accuracy by permitting
diffraction calibration on the same substrate as the sample. Avoids the
effects of electronic or physical changes occurring during changeover from
the standard to the unknown. Specify desired substrate
No. 10092: Gold Internal Diffraction Calibration Standard.
No. 10093: Aluminum Internal Diffraction Calibration Standard.
No. 10800: SEM Cu-Al All Purpose Standard
A 400 mesh pure copper grid mounted on an aluminum SEM mount which
provides:
No. 10801: SEM Cu-Al All Purpose Standard
Same as above but with mesh size of your choice. Please specify
mesh size and mount desired.
No. 60041: SEM Resolution/Astigmatism Correction
Standard
Evaporated gold on polished pyrolytic graphite. Non-uniform, discontinuous
film can be imaged at 40,000X. Resolution is determined by measuring the
distances between gold particles at known magnifications. Please specify
mount by catalog number.
No. 17490: Resolution And Calibration Standard
For calibrating magnification and evaluating the resolving power of
the instrument. Fragments of a 2,160 lines/mm crossed lines grating replica
are deposited on a fine structured substrate mounted on a standard specimen
mount. A magnification standard regardless of tilt. The fine structure
substrate permits point-to-point measurements below 20.0 nm. Please
specify mount by catalog number.
EFFA® SEM Particle Mount
Three component particle mount for use with image analyzers, BSE detectors
and/or EDS systems. Consists of stainless steel, glass and nickel microspheres
in a size range of 5 to 20um. Spheres are dispersed on a polycarbonate
filter attached to a carbon planchet. Mount has a conductive coating of
20.0nm of gold or carbon. Ideal test specimen for image analysis system
performance, obtaining x-ray maps or line scans using EDX analyzers and
showing atomic number contrast with the SEM BSE detector.
No. 60030: EFFA® Carbon Coated Particle Mount.
No. 60031: EFFA® Gold Coated SEM Particle Mount.
