Electron Microscopy Standards

Image Checker

Resolution Standards

Electron Diffraction Standards

Thallous Chloride Standard

Aluminum Standard

Internal Diffraction Calibration Standards

Light Microscopy Standards

Scanning Microscopy Standards

SEM Cu-Al All Purpose Standard

SEM Resolution/Astigmatism Correction Standard

Resolution and Calibration

EFFA® SEM Particle Mount

Electron Microscopy Standards

No. 10070: Image Checker
A carbon film with many holes of various sizes. More stable and easier to observe than carbon lace under the electron beam. Mounted on a copper grid. Determines quality of image, astigmatism and compensation of objective pole pieces. . . . .$17.50

No. 10090: Resolution Standard
Gold-palladium particles used for determining the resolving power of the electron microscope by the point-to-point separation method. Made by shadow casting at a low angle with gold-palladium over tungsten oxide particles deposited on a super thin film for maximum contrast. Mounted on a 400 mesh copper grid. . . . .$11.90

Electron Diffraction Standards

No. 10340: Aluminum Standard
99.99% pure aluminum deposited on a stable substrate provides accurate "d" spacing measurements as a standard. ASTM "d" values of Al included in instructions. . . . .$6.60

Internal Diffraction Calibration Standards
Gold or aluminum coating over one-third of a standard Vinylec (Polyvinyl Formal) or nitrocellulose substrate. Provides necessary accuracy by permitting diffraction calibration on the same substrate as the sample. Avoids the effects of electronic or physical changes occurring during changeover from the standard to the unknown. Specify desired substrate

No. 10092: Gold Internal Diffraction Calibration Standard. . . . .$9.20
No. 10093: Aluminum Internal Diffraction Calibration Standard. . . . .$9.20

Scanning Microscopy Standards

No. 10800: SEM Cu-Al All Purpose Standard
A 400 mesh pure copper grid mounted on an aluminum SEM mount which provides:

• Low magnification SEM calibration
• X-Y calibration (squared image)
• The low (aluminum) and high (copper) x-ray energy peaks required for energy dispersive x-ray analyzer calibration.

No. 10801: SEM Cu-Al All Purpose Standard
Same as above but with mesh size of your choice. Please specify mesh size and mount desired. . . . .$14.50

No. 60041: SEM Resolution/Astigmatism Correction Standard
Evaporated gold on polished pyrolytic graphite. Non-uniform, discontinuous film can be imaged at 40,000X. Resolution is determined by measuring the distances between gold particles at known magnifications. Please specify mount by catalog number. . . . .$27.20

No. 17490: Resolution And Calibration Standard
For calibrating magnification and evaluating the resolving power of the instrument. Fragments of a 2,160 lines/mm crossed lines grating replica are deposited on a fine structured substrate mounted on a standard specimen mount. A magnification standard regardless of tilt. The fine structure substrate permits point-to-point measurements below 20.0 nm. Please specify mount by catalog number. . . . .$29.40

No. 17480: X-Checker Calibration Aid
Monitors EDS spectrometer performance. Features Mn to check detector resolution, Al and Cu to check spectrometer calibration and C to monitor calibration in the low end of the spectrum. Includes full instructions and storage case. 1" dia. x 10mm H. . . . .$301.00

EFFA® SEM Particle Mount
Three component particle mount for use with image analyzers, BSE detectors and/or EDS systems. Consists of stainless steel, glass and nickel microspheres in a size range of 5 to 20um. Spheres are dispersed on a polycarbonate filter attached to a carbon planchet. Mount has a conductive coating of 20.0nm of gold or carbon. Ideal test specimen for image analysis system performance, obtaining x-ray maps or line scans using EDX analyzers and showing atomic number contrast with the SEM BSE detector.

No. 60030: EFFA® Carbon Coated Particle Mount. . . . .$36.75
No. 60031: EFFA® Gold Coated SEM Particle Mount. . . . .$36.75