Scintillator discs for SEMs and stems by Taylor Engineering. These discs have quartz substrates with P47P phosphor for improved S/N ratio. High brightness at medium cost.
Amray
No. 36003: Amray 1200, 9.5mm diameter. . . . .$108.00
No. 36004: Amray 900, 1000, 1400, 1700, 1800 and other 19mm
diameter. . . . .$108.00
ARL-Probe
No. 36001: ARL-Probe, ¾" diameter, 0.0285" thick. . . . .POR
Cambridge
No. 36002: Cambridge S-600, 604, ½" diameter. . . . .$108.00
No. 36015: Cambridge, 9mm diameter. . . . .$108.00
No. 36016: Cambridge, 10mm diameter. . . . .$108.00
No. 36017: Cambridge, 12mm diameter. . . . .$108.00
Cam Scan
No. 36011: Cam Scan III and Balscan, 18mm diameter. . . . .$108.00
ETEC
No. 36005: ETEC, 0.360" diameter, 1/8" thick. . . .
.$108.00
Hitachi
No. 36018: Hitachi upper stage, 10mm diameter. . . . .$204.00
No. 36006: Hitachi 20mm diameter, no metal ring. . . . .$108.00
No. 36007: Hitachi 19.8mm diameter, with metal ring. . . . .$204.00
ISI/Topcon
No. 36008: ISI/Topcon Super I, II, II, IIIA, 60, 40, 100, DS 130,
SS, SX and others (13.5mm disc). . . .
.$108.00
No. 36009: ISI/Topcon Mini 2, 3, V (7.7mm disc). . . . .$108.00
JEOL
No. 36012: JEOL 8.8mm diameter, 2mm thick. . . . .$108.00
No. 36013: JEOL 19mm diameter, 1mm thick. . . . .$108.00
No. 36014: JEOL 20mm diameter, 1mm thick. . . . .$108.00
No. 36010: Zeiss SEMCO/Novascan, 16.6mm diameter. . . . .$108.00
No. 54760: Plastic Stereo Viewer:
Inexpensive. Easily adjustable interpupillary distance. Folding. Height:
120mm from stereo pair. Packed in a plastic bag. 2X magnification. . . . .$7.75
No. 11760: Stereoscopic Viewer
For observing stereoscopic prints. Fixed focus. Interpupillary distance is adjustable. Folding
legs. Case included. 2X magnification. . . . .$36.25
No. 54780: Stereo Mounting Kit
A simplified method of aligning and mounting stereo pairs of micrographs.
Instructions included.
Pkg/10. . . . .$8.00
For measuring beam current during elemental analysis. Beam trap is retractable when not in use. Faraday Cups can be designed for almost any SEM. Working parts can also be combined with a micromanipulator.
No. 15868: Camscan 4. . . . .POR
No. 15869: Hitachi S-570/2700. . . . .POR
No. 15870: Amray-1000. . . . .POR
No. 15871: Amray-1000a Universal. . . . .POR
No. 15872: Etec Autoscan. . . . .POR
No. 15873: ISI/Topcon 3" Stage. . . . .POR
No. 15874: ISI/Topcon 4" Stage. . . . .POR
No. 15875: JEOL JSM U-3. . . . .POR
No. 15876: JEOL JSM-35. . . . .POR
No. 15877: Phillips 501b/505. . . . .POR
No. 15878: Bausch & Lomb. . . . .POR
No. 15879: Cambridge 200/250. . . . .POR
Semi-Conductor Mini-Probe Mount
1" aluminum disc with two to four probe arm assemblies. Disc mounted
on SEM pin or stub mount of your choice. Probe arm tips are 00 stainless
steel entomology pins. Posts are insulated from base. Probes are set-up
under a low power microscope before placing in SEM chamber. Useful for
voltage contrast studies of ICs, chips, etc. Available in special sizes
and arrangements. Specify mount desired by catalog number.
No. 18152: Semi-Conductor Mini-Probe Mount
With two probe arm assemblies. . . . .POR
No. 18153: Semi-Conductor Mini-Probe Mount
With three probe arm assemblies. . . . .POR
No. 18154: Semi-Conductor Mini-Probe Mount
With four probe arm assemblies. . . . .POR
No. 18155: Semi-Conductor Mini-Probe Mount
Made to order. Special sizes or arrangements available. . . . .POR
No. 18151: Probe Arm Assemblies
Available separately, unmounted. . . . .POR
Other Holders
No. 18313: JSM-35 Metallographic Holder
Holds 1¼" diameter metallographic mounts. Top of holder is at 25mm
sample height. Also fits JSM-840 and later JEOL large SEMs. . . . .$494.00
No. 17370: Rotating-Tilting Holder
Permits 90° tilt and/or simultaneous 360° rotation while in
the chamber. May also be preset and locked in position. Available for most
SEMs and microprobes. . . . .POR
STEM Holder
Permits TEM studies in SEM using 3.05mm grids. Holder is rotated so
that reflector faces photomultiplier tube.
No. 18300: STEM Holder, Universal Model
Fits over stub. Specify make and model of microscope. . . . .$723.00
No. 18301: STEM Holder, JEOL Model
Features dovetail base for airlock loading. Specify model of microscope.
. . . .$923.00
No. 18303: Forward Scattering Electron Imaging Sample Holder
Places the sample at a high tilt angle to the beam. Forward scattered high
energy electrons strike a Pt reflector and create secondary electrons that are
collected by the SED. The sample surface is pointed away from the SED so that
only the forward scattered electrons contribute to the image. Produces a high
contrast image with a resolution of 1-2nm without an electron energy filter.
Produced
under license. US Pat. No. 7,005,652. . . . . . . .$358.00
SEM Universal Holders
No. 18306: Universal Holder for JSM 5800 and 2900
Has dovetail base for JSM 5800 and 5900. . . . .$569.00
No. 18308: Universal Holder, JEOL T-300
Has 14mm threaded stud for early T-300s, to serial number 167033. .
. . .$386.00
No. 18309: Universal Holder, Non-FE SEMs
Features the same reversible jaw inserts and spring loaded jaws. Can
be loaded through Hitachi airlock. . . . .$390.00
No. 18310: Universal Holder, ISI/Topcon
Reversible jaws hold irregular samples up to 1¼" diameter. 1"H x
2"W x 2¼"L.
Has a 6mm mounting pin for ISI/Topcon stages. . . . .$340.00
No. 18318: Universal Holder, Electroscan
Similar to No. 18310, but has 1¼ pin for Electroscan stages. . .
. .$309.00
No. 18311: Universal Holder, JSM-845
Similar to No. 18312, but with raised base to fit JSM 845 stages.
. . . .$627.00
No. 18312: Universal Holder, JSM-35, 840 & 6000 Series
Narrower width with dovetail base. Can be loaded through JEOL airlock.
. . . .$505.00
NOTE: JEOL holders are available with brass dovetail bases for an additional charge. Brass dovetails are more wear-resistant and are recommended for holders receiving heavy usage.
No. 18314: Universal Holder, later JEOL T-300/330
Has dovetail base for JEOL T-300s from serial number 167034 and T-330s
. . . $505.00
No. 18315: Universal Holder, Hitachi S-800 And S-4000 Series FE
SEMs
Features the same reversible jaw inserts and spring loaded jaws. Can
be loaded through Hitachi airlock. . . . .$760.00
No. 18317: Hitachi Holder Base Only. . . . .$452.00
No. 18316: Low Profile Jaws For Universal Holders
Designed for Universal Holders in SEMs with low eucentric heights.
Jaws will fit existing universal holders. Low Profile Jaws can be substituted
for the standard jaws on new holders with no change in price. . . . .$95.00
No. 18319 Universal Specimen Holder for Philips XL30
Our familiar universal holder with a threaded stud for later Philips
SEM stages. Accepts standard or low-height jaw inserts. . . . .$309.00
One-Hand SEM Universal Holders
Similar to our earlier Universal Holder, but easier to use. The clamping
jaws are opened by squeezing the holder with one hand, leaving the other
free to load a sample. On SEMs without airlocks, the sample can easily
be changed without removing the holder from the stage. Available for most
SEMs.
No. 18320: One-Hand Universal Holder, ISI/Topcon
Reversible jaws hold irregular samples up to 1¼" diameter. 1"H x
2"W x 2¼"L.
Has a 6mm mounting pin for ISI/Topcon stages. . . . .$309.00
No. 18328: One-Hand Universal Holder, Electroscan
Similar to No. 18310, but has ¼" pin for Electroscan stages. . .
. .$310.00
No. 18322: One-Hand Universal Holder, JSM-35, 840 & 6000 Series
Narrower width with dovetail base. Can be loaded through JEOL airlock.
. . . .$421.00
No. 18324: One-Hand Universal Holder, later JEOL T-300/330
Has dovetail base for JEOL T-300s from serial number 167034 and T-330s. . .
$421.00
No. 18325: One-Hand Universal Holder, Hitachi S-800 And S-4000 Series
FE SEMs
Features the same reversible jaw inserts and spring loaded jaws. Can
be loaded through Hitachi airlock. . . . .$760.00
No. 18329 Universal Holder for Philips XL30
Our familiar universal holder with a threaded stud for later Philips
SEM stages. Accepts standard or low-height jaw inserts. . . . .$310.00
No. 18330: One-Hand Universal Holder, JEOL T-300
Has 14mm threaded stud for early T-300s, to serial number 167033. .
. . .$376.00
No. 18331: One-Hand Universal Holder, Non-FE SEMs
Features the same reversible jaw inserts and spring loaded jaws. Can
be loaded through Hitachi airlock. . . . .$390.00
No. 18332: One-Hand Universal Holder, Cambridge SEMs
. . . . .348.00
No. 18333: One-Hand Universal Holder, for JSM 5800 & 5900 SEMs
. . . . .495.00
NOTE: Holders can be supplied with any type of pin, stub or tapped hole in the base as well as a plain base for use under a stereo microscope.
No. 18305: EBSD Quick-Change Sample
Holder
Holds two 1½" metallographic samples for EBSP analysis. Open-sided
design with leaf spring retainers permits very rapid sample changes. Upper
retainer plate provides a standard reference height for all mounted samples.
Without Adapters. Adapters available for 1" and 1¼" mounts. . . . .POR
Triple Probe Micromanipulator for JEOL
Probes And Micromanipulators
Using a micromanipulator, a specimen may be probed, marked, or otherwise
handled while under observation in the SEM. The probe arm is electrically
isolated from the frame and may be energized for signal application or
retrieval. A probe arm can also be fitted with a Faraday cup. With care
in operation, a positioning resolution of 3-4um is possible. Bellows-sealed
versions are available for Field Emission or high vacuum microscopes.
Bellows sealed FE Single Probe Micromanipulator
Micromanipulators have been built for over 30 different makes and models of SEMs. New versions are developed as customer demand dictates. Selling prices depend on the complexity required. Please specify SEM make and model number when requesting a quotation.
A variety of special tools such as picks, knives, and scrapers may be fitted to the probe arm. Standard probe tips have a tip radius of 0.6um. Ultra-fine "catwhisker" probe tips with a radius of 0.07um are also available.
Single Probe Micromanipulator
Dual-arm micromanipulators have two independent mechanisms on a common port cover. There is sufficient travel in the mechanism to allow the probes to be withdrawn from the field when not in use. All models have both coarse and fine movement in the vertical axis.
No. 15855: High Resolution SEM Micromanipulator
Specify make and model of microscope. . . . .POR
No. 15863: Replacement Tungsten Probe
For units made after 6/83, 0.6um tip radius, each. . . . .$10.50
No. 15864: Ultraminiature Catwhisker Probe
0.07um tip radius, each. . . . .$12.00
Ernest F. Fullam, Inc.
750 Pierce Road, Suite 2
Clifton Park, New York 12065-1303
Phone: 518-877-0820, 800-833-4024
Fax: 518-877-3885
e-mail sales@fullam.com
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